Plasma resonance in the reflection spectrum of thin aluminium films

B. Feuerbacher, R. P. Godwin, M. Skibowski

The reflectance of thin Al fims has been measured near the plasma wavelength (840 Å) at a pressure of 2 × 10-9 Torr using synchrotron radiation as light source. For parallel-polarized light a plasma resonance maximum was found together with a Brewster minimum. © 1968.

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Materials
Curve 1
Temperature, K: ~298 Wavelength Range, μm: 0.045-0.108 Geometry θ' β': 15° 15° Composition (weight percent), Specifications, and Remarks: Aluminum(~150 Å thick); glass substrate; vapor deposited in vacuum (2 x 10^-6 mm Hg); parallel-polarized incident light; data extracted from smooth curve.
Curve 2
Temperature, K: ~298 Wavelength Range, μm: 0.045-0.108 Geometry θ' β': 30° 30° Composition (weight percent), Specifications, and Remarks: Above specimen and conditions.
Curve 3
Temperature, K: ~298 Wavelength Range, μm: 0.045-0.108 Geometry θ' β': 45° 45° Composition (weight percent), Specifications, and Remarks: Above specimen and conditions.
Curve 4
Temperature, K: ~298 Wavelength Range, μm: 0.050-0.108 Geometry θ' β': 75° 75° Composition (weight percent), Specifications, and Remarks: Above specimen and conditions.
Curve 5
Temperature, K: ~298 Wavelength Range, μm: 0.050-0.108 Geometry θ' β': 82.5° 82.5° Composition (weight percent), Specifications, and Remarks: Above specimen and conditions.