Normal-incidence reflectance of aluminum films in the wavelength region 800-2000 Å
R. C. Vehse, E. T. Arakawa, J. L. Stanford
No abstract provided
Materials
Curve 1
Temperature K: 298
Wavelength Range, μ: 0.079-0.1175
Geometry θ θ' ω': ~0° ~0° ~0°
Composition (weight percent), Specifications and Remarks: Evaporated film; 99.999 pure; evaporated on microscope slide at 3 x 10-8 mm Hg; measured in vacuum (3 x 10-8 mm Hg) 4 min after evaporation.
Curve 2
Temperature K: 298
Wavelength Range, μ: 0.079-0.1175
Geometry θ θ' ω': ~0° ~0° ~0°
Composition (weight percent), Specifications and Remarks: Different sample, same as above specimen and conditions except measured 8 min after evaporation.
Curve 3
Temperature K: 298
Wavelength Range, μ: 0.079-0.1175
Geometry θ θ' ω': ~0° ~0° ~0°
Composition (weight percent), Specifications and Remarks: Different sample, same as above specimen and conditions except measured 12 min after evaporation.
Curve 4
Temperature K: 298
Wavelength Range, μ: 0.079-0.1175
Geometry θ θ' ω': ~0° ~0° ~0°
Composition (weight percent), Specifications and Remarks: Different sample, same as above specimen and conditions except measured 16 min after evaporation.