W. G. Spitzer, G. W. Gobeli, F. A. Trumbore
An experimental study has been made of the effect of high-temperature vacuum heat treatment on the infrared reflectivity of heavily doped germanium and silicon. The heat treatment produces a layer on the surface with optical properties differing from those of the bulk material. From a Kramers-Kronig analysis of the reflectivity data for an n-type silicon sample, where the time of heating is sufficiently short to make impurity out-diffusion unimportant, it is concluded that the changes in free-carrier electric susceptibility indicate a decrease in the low-frequency-scattering relaxation time. The change in relaxation time is attributed to the introduction of extensive surface fracture from the heating. The extinction coefficient was not obtained over a sufficient spectral range to ascertain whether it follows the classical expression; however, the results for the extinction coefficient indicate an increase in the high-frequency relaxation time. © 1964 The American Institute of Physics.
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