Electrical and structural properties of mixed chromium and silicon monoxide films
Alvin A. Milgram, Chih Shun LU
Films containing a mixture of chromium and silicon monoxide were prepared on glass substrates by vacuum deposition. The significance of various deposition parameters was determined. The films were examined by x-ray diffraction, electron microscopy, and ir reflectance and transmission. The electrical conductivity was measured as a function of temperature and applied electrical field. A relationship between film structure and electrical conductivity was found for film compositions which were almost metallic to almost insulating. © 1968 The American Institute of Physics.
