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Publications: 167   Total entries: 1251

Infrared lattice vibrational spectra of AgCl, AgBr, and AgI

G. L. Bottger, A. L. Geddes

The infrared transmission spectra of AgCl, AgBr, and AgI have been measured between 400-30 cm-1 at room temperature and at 143°K. Strong absorptions characteristic of the transverse optic modes were found, together with weak subsidiary absorptions arising from multiphonon combinations. …

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7 entries

SILVER IODIDE AgI: Normal spectral transmittance
SILVER BROMIDE AgBr: Normal spectral reflectance, Normal spectral transmittance
SILVER CHLORIDE AgCl: Normal spectral transmittance

Optical absorption in silicon monoxide

I. R. Rawlings

Measurements of the transmission spectra of thick silicon monoxide films are reported, and from these the absorption coefficient of silicon monoxide is calculated as a function of wavelength. The results obtained are compared with the predictions of a simple theoretical …

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1 entries

POTASSIUM BROMIDE KBr: Normal spectral transmittance

Current Saturation in the Evaporated GaAs Films

A. Yamashita, T. Tuzaki, T. Yamada, I. Yamauchi

Current saturation in evaporated GaAs films was observed. Thin GaAs films were fabricated by means of simultaneous evaporation of the elements of the highest purity onto the metal substrate of the Ta. Electrical characteristics of the films were measured employing …

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1 entries

GALLIUM ARSENIDE GaAs: Normal spectral transmittance

Dielectric dispersion of some perovskite zirconates

C. H. Perry, D. J. Mccarthy, G. Rupprecht

The assignment of the normal-mode spectrum in perovskites has been achieved by a comparison of the vibrations of calcium, strontium, barium, and lead titanates and zirconates. In addition, for the antiferro-electric material lead zirconate, about 90% of the value of …

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4 entries

MISCELLANEOUS ZIRCONATES: Normal spectral reflectance

High Purity Powdered Csl as a High Reflectance Infrared Diffuser

Jon Geist, Gerhart J. Kneissl, V. R. Weidner

No abstract provided

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3 entries

CESIUM IODIDE CsI: Normal spectral reflectance

Optical properties and band structure of group IV-VI and group V materials

Manuel Cardona, D. L. Greenaway

Room-temperature reflectivity measurements over the energy range 0.5 to 25 eV have been made on the lead salts PbS, PbSe, PbTe, and on SnTe and GeTe; reflection curves have also been obtained for the structurally closely related Group V semimetals …

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22 entries

MISCELLANEOUS SELENIDES: Normal spectral reflectance, Normal spectral transmittance
LEAD SULFIDE PbS: Normal spectral reflectance, Normal spectral transmittance
GERMANIUM TELLURIDE GeTe: Normal spectral reflectance
LEAD TELLURIDE PbTe: Normal spectral reflectance, Normal spectral transmittance
TIN MONOTELLURIDE SnTe: Normal spectral reflectance, Normal spectral transmittance

Infrared absorption of indium antimonide

Eugene Blount, Joseph Callaway, Morrel Cohen, William Dumke, James Phillips

Infrared absorption in InSb near the absorption edge has been interpreted as the superposition of two indirect transitions requiring phonons of 100°and 30°, the former transition involving the smaller electronic energy gap. The first transition is consistent with a band …

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7 entries

InSb INTERMETALLIC COMPOUND: Normal spectral transmittance

Reflecting-power measurements in the spectral region 2000 A. to 1300 A

B. K. Johnson

This report contains a description of the experimental method employed for measuring the reflection coefficients of nine materials in the spectral region 2000 A. to 1300 A., together with the results obtained.

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2 entries

LITHIUM FLUORIDE LiF: Normal spectral reflectance
MISCELLANEOUS INTERMETALLIC COMPOUNDS: Normal spectral reflectance

Erratum: Phase-shift-corrected thickness determination of silicon dioxide on silicon by ultraviolet interference (Journal of Applied Physics (1967) 38 (2455))

R. A. Wesson, R. P. Phillips, W. A. Pliskin

No abstract provided

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2 entries

SILICON CONVERSION COATINGS: Angular spectral reflectance

Reststrahl Reflection Characteristics of Amorphous Silica

Kenzo Sato, Miyoko Shibata

The Reststrahl reflection characteristics in the wavelength region 1-25µ of silica films, a few thousand ångstroms in thickness, have been studied. The films were grown on silicon wafers under controlled conditions. The reflection maxima in the Si-O stretching and Si-O …

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19 entries

SILICON CONVERSION COATINGS: Normal spectral reflectance
POTASSIUM IODIDE KI: Normal spectral reflectance
RUBIDIUM IODIDE RbI: Normal spectral reflectance