EKHI

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Publications: 167   Total entries: 1251

Optical measurements on the antiferromagnetic semiconductor MnTe

G. Zanmarchi

The light transmission and reflection of the antiferromagnetic semiconductor MnTe with Néel temperature TN = 307°K, have been measured for wavelengths ranging from the visible spectrum to 24 μ, and for different temperatures T from 80°K up to 375°K. The …

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7 entries

MANGANESE TELLURIDE MnTe: Normal spectral reflectance

Reflectivity of tin telluride in the infrared

H. R. Riedl, J. R. Dixon, R. B. Schoolar

The reflectivity of tin telluride at near-normal incidence and room temperature was measured at wavelengths from 1 to 200. Thirteen single-crystal samples with free-hole concentrations ranging from 4.8×1019 cm-3 to 4.8×1020 cm-3 were studied. In the wavelength range from 3 …

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27 entries

TIN MONOTELLURIDE SnTe: Normal spectral reflectance
MISCELLANEOUS SILICIDES: Normal spectral reflectance

The Optical Reflectivity Spectra of CdSb and ZnSb Single Crystals

E. M. Averbakh, V. V. Sobolev, N. N. Syrbu, YA A. Ugat

No abstract provided

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12 entries

CdSb INTERMETALLIC COMPOUND: Normal spectral reflectance
ZnSb INTERMETALLIC COMPOUND: Normal spectral reflectance

Measurement and analysis of the infrared reflection spectrum of semiconducting SnS

C. Haas, M. M.g. Corbey

The infrared reflection spectrum of p-type SnS single crystals was measured between 2 and 25μ. The observed dispersion was ascribed to the combined effects of lattice vibrations and free holes. An analysis gave for the index of refraction n0 = …

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2 entries

MISCELLANEOUS SULFIDES: Normal spectral reflectance

Magnetic ordering effects on the reflectivity of EuS and EuSe

C. R. Pidgeon, J. Feinleib, W. J. Scouler, J. Hanus, J. O. Dimmock, T. B. Reed

The reflectivity of the ferromagnetic semiconductors EuS and EuSe has been measured as a function of temperature and polarization in a domain orienting magnetic field. The triplet structure below Tc and the doublet above are evidence that the absorption edge …

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1 entries

MISCELLANEOUS SULFIDES: Normal spectral reflectance

Optical Properties of Hexagonal ZnS Single Crystals

W. W. Piper, D. T.f. Marple, P. D. Johnson

The optical transmission of hexagonal zinc sulfide crystals has been measured in the spectral range from 0.32 to 15 μ. From the spacing of interference maxima, the dependence of index of refraction on wavelength has been determined. Measurements of the …

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7 entries

ZINC SULFIDE ZnS: Normal spectral transmittance

Optical Properties of Epitaxial PbS Films in the Energy Range 2-6 eV

C. E. Rossi, William Paul

The reflectivity of epitaxial PbS films has been compared with the reflectivity of bulk PbS in the energy range 2.1 to 6.2 eV and found to agree in both magnitude and structure within a few percent at energies where interference …

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8 entries

LEAD SULFIDE PbS: Normal spectral reflectance, Normal spectral transmittance

Reflectivity of several crystals in the far infrared region between 20 and 200 microns

Hiroshi Yoshinaga

No abstract provided

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3 entries

MISCELLANEOUS SELENIDES: Normal spectral reflectance
LEAD SULFIDE PbS: Normal spectral reflectance

The Reflectance of the Intermetallic Compounds NiAl and CoAl

D. A. Kiewit, J. O. Brittain, J. Rechtien

The reflectivities at normal incidence of samples of the intermetallic compounds NiAl and CoAl are presented in the photon energy region from 0.5 to 6.0 eV. The data and their interpretation are compared with those of Sambongi, Hagiwara and Yamadaya …

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4 entries

NiₓAl INTERMETALLIC COMPOUNDS: Normal spectral reflectance
MISCELLANEOUS INTERMETALLIC COMPOUNDS: Normal spectral reflectance

Electrical and structural properties of mixed chromium and silicon monoxide films

Alvin A. Milgram, Chih Shun LU

Films containing a mixture of chromium and silicon monoxide were prepared on glass substrates by vacuum deposition. The significance of various deposition parameters was determined. The films were examined by x-ray diffraction, electron microscopy, and ir reflectance and transmission. The …

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1 entries

ZINC SULFIDE ZnS: Normal spectral reflectance