EKHI
The open database of optical and radiative data
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Publications: 167 Total entries: 1251
Optical Absorption of Longitudinal and Transverse Excitons in KCl and KBr
Arisato Ejiri
No abstract provided
3 entries
Thin film emission of KBr, RbCl, RbBr and NaCl in the far infra-red
J. E. Mooij, W. B. Van DE Bunt, J. E. Schrijvers
The emission coefficient E of thin films (2-9μ) of KBr, RbCl, RbBr and NaCl has been measured between 50 and 250 cm^{-1}. An expression for E is given. Values of ω_{0} and \Gamma for the TO oscillator between 350°K and …
3 entries
An integrating-sphere reflectometer for the determination of absolute hemispherical spectral reflectance
Gene A. Zerlaut, A. C. Krupnick
An instrument for measuring the absolute hemispherical spectral reflectance of surfaces was designed. It possesses the ability to measure and monitor the absolute reflectance of a magnesium oxide or other standard and to compare this reflectance with that of any …
2 entries
MAGNESIUM CARBONATE MgCO₃: Normal spectral reflectance
Optical properties of thin films of indium arsenide
R. P. Howson
Thin films of indium arsenide have been prepared by the vacuum evaporation of the elements on to heated glass substrates. The optical constants were obtained by analysis of the interference fringes shown in quantitative transmittance measurements made in the wavelength …
5 entries
Selective radiation coatings. Preparation and high temperature stability
Panos Kokoropoulos, Ehab Salam, Farrington Daniels
Selective radiation coatings suitable for operation at high temperatures with focused sunlight are described. Coatings of CuO and Co3O4 on polished nickel, silver, and platinum have high absorptivity for solar radiation and low emissivity in the infrared when heated. They …
9 entries
COPPER OXIDE CONTACT COATINGS: Normal total emittance
Inorganic films for solar energy absorption
R. Langley
No abstract provided
1 entries
Preparation and properties of sputtered bismuth oxide films
P. B. Clapham
Apparatus is described which is capable of producing thin films of bismuth oxide with refractive index 2.50 and index of absorption 0.03 (both measured at a wavelength of 5500 Å). The results described show the necessity for close control of …
12 entries
Note on reflectance measurements on metals
W. E. Müller
No abstract provided
1 entries
A comparison of infrared-emittance measurements and measurement techniques
John P. Millard, Elmer R. Streed
Values of directional and hemispherical emittance of twelve coatings were needed in support of a spacecraft experiment. Laboratory measurements were made by two calorimetric and four reflectance techniques and with two portable devices designed for field or laboratory operation. The …
26 entries
SILICON DIOXIDE CONTACT COATINGS: Normal spectral reflectance, Hemispherical total emittance
ALUMINUM CONVERSION COATINGS: Normal spectral reflectance, Hemispherical total emittance
Infrared reflectance of paints
Arthur B. Krewinghaus
The Kubelka–Munk coefficients for paint films in the 0.8–2.0–μ wavelength range are determined from reflectance measurements on films of several different thicknesses over a black substrate. The scattering coefficients S of the paints studied are inversely proportional to the wavelength …
1 entries